Validity Report
Full Report
US6854067B1 — Method and system for interaction between a processor and a power on reset circuit to dynamically control power states in a microcontroller
Priority Date: 2000-10-30, Publication Date: 2005-02-08, Current Assignee: Heritage Ip LLC, Monterey Research LLCReport Generated: 2021-07-14

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Current Assignee
EP1086466A10.828MICROCONTROLLER HAVING WRITE ENABLE BITGRANT2001-03-281999-03-0923007269GreatMicrochip Technology IncMicrochip Technology Inc
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EP0712064B10.777Variable frequency clock control for microprocessor-based computer systemsGRANT2000-08-301994-10-1123250168GreatCompaq Computer CorpCompaq Computer Corp
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EP1309909A20.726METHOD AND APPARATUS TO PROVIDE DETERMINISTIC POWER-ON VOLTAGE IN A SYSTEM HAVING PROCESSOR-CONTROLLED VOLTAGE LEVELGRANT2003-05-142000-07-2424492255GreatAdvanced Micro Devices IncAdvanced Micro Devices Inc
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EP0840956A10.709MICROCONTROLLER HAVING A MINIMAL NUMBER OF EXTERNAL COMPONENTSGRANT1998-05-131996-05-2424586892GreatMicrochip Technology IncMicrochip Technology Inc
EP0671009B10.703PROGRAMMABLE ELECTRICAL ENERGY METER AND METHODS THEREFORGRANT1998-09-231992-02-2125279065GreatABB Power T&D Co IncABB Inc USA
EP0895150A20.703Power-down circuitGRANT1999-02-031997-08-0125420908GreatPitney Bowes IncPitney Bowes Inc
EP1078465A10.701ZERO DC CURRENT POWER-ON RESET CIRCUITGRANT2001-02-281998-05-2022170436GreatMaxim Integrated Products IncMaxim Integrated Products Inc
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US5115146A0.634POWER-ON RESET CIRCUIT FOR CONTROLLING TEST MODE ENTRYGRANT1992-05-191990-08-1724273678GreatSGS Thomson Microelectronics IncSTMicroelectronics lnc USA
EP0780000B10.632PERFORMING SYSTEM TASKS AT POWER-OFF USING SYSTEM MANAGEMENT INTERRUPTGRANT1999-12-291994-09-0723163492GreatInternational Business Machines CorpInternational Business Machines Corp
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Predictive Analytics

Composite Research Score (1-10)
9
  HARD
Art VolumeHIGH
Tech ComplexityINTRICATE
Priority DateMID
Tech DiversityBROAD
Expert Services Estimate$4,950 — $5,400
There is where a graph would go if the browser supported it.
There is where a graph would go if the browser supported it.

CPC Technology Profile

Possible Classes
239
Recommended Classes
60
Government Assigned Classes
2
CPC
Title
Score
G06F1/24Resetting means2.208
H03K17/223in field-effect transistor switches0.958
H03K17/22Modifications for ensuring a predetermined initial state when the supply voltage has been applied | bi-stable generators | (ref: H03K3/12)0.949
G06F1/30Means for acting in the event of power-supply failure or interruption  e.g. power-supply fluctuations | for resetting only | (ref: G06F1/24)0.935
G01R31/3181Functional testing | (ref: G01R31/3177)|  takes precedence0.845
H03K17/20Modifications for resetting core switching units to a predetermined state0.842
G06F1/28Supervision thereof  e.g. detecting power-supply failure by out of limits supervision0.832
G06F1/26Power supply means  e.g. regulation thereof | for memories | (ref: G11C)0.828
G05F1/575characterised by the feedback circuit0.824
H03K5/01Shaping pulses | discrimination against noise or interference | (ref: H03K5/125)0.818
G05F1/461using an operational amplifier as final control device0.818
G06F1/3296Power saving by lowering supply or operating voltage0.817
G01R31/2856Internal circuit aspects  e.g. built-in test features| Test chips| Measuring material aspects  e.g. electro migration [EM]0.808
H03K3/012Modifications of generator to improve response time or to decrease power consumption0.806
G06F1/3203Power Management  i.e. event-based initiation of power-saving mode0.805
G06F1/32Means for saving power0.804
G11C7/00Arrangements for writing information into  or reading information out from  a digital store | (ref: G11C5/00)|  takes precedence| auxiliary circuits for stores using semiconductor devices | (ref: G11C11/4063)|   | (ref: G11C11/413)|  0.796
G11C16/30Power supply circuits0.795
H03L7/00Automatic control of frequency or phase| Synchronisation | tuning of resonant circuits in general | (ref: H03J)| | synchronising in digital communication systems  | see|  the relevant groups in class | (ref: H04)0.795
G06F13/16for access to memory bus | (ref: G06F13/28)|  takes precedence0.791
H03K3/356008ensuring a predetermined initial state when the supply voltage has been applied| storing the actual state when the supply voltage fails | digital storage cells each combining volatile and non-volatile storage properties | (ref: G11C14/00)0.787
G11C11/417for memory cells of the field-effect type0.785
G06F11/1604where the fault affects the clock signals of a processing unit and the redundancy is at or within the level of clock signal generation hardware0.785
G05F3/26Current mirrors0.783
G11C5/147Voltage reference generators  voltage and current regulators | in general | (ref: G05F3/24)| | Internally lowered supply level | in general | (ref: G05F1/462)| | Compensation for voltage drops | (ref: G11C5/141)|  takes precedence0.775
G11C7/20Memory initialisation circuits  e.g. when powering up or down  memory clear  latent image memory0.769
G01R31/2832Specific tests of electronic circuits not provided for elsewhere | contains no documents| | (ref: G01R31/2801)|  and | (ref: G01R31/316)|  take precedence0.766
H03K19/1776for memories0.766
G05B19/04Programme control other than numerical control  i.e. in sequence controllers or logic controllers | (ref: G05B19/418)|  takes precedence| numerical control | (ref: G05B19/18)0.764
G05F1/66Regulating electric power0.764
H03K5/1252Suppression or limitation of noise or interference | specially adapted for transmission systems | (ref: H04B15/00)|   | (ref: H04L25/08)0.764
G05F1/56using semiconductor devices in series with the load as final control devices | (ref: G05F1/461)|  takes precedence0.762
H03K19/0013in field effect transistor circuits0.758
H03K19/018585programmable0.755
G06F1/324Power saving by lowering clock frequency0.755
G11C8/10Decoders0.753
G05F3/247producing a voltage or current as a predetermined function of the supply voltage0.752
H03K5/24the characteristic being amplitude0.750
G05F3/30Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities | (ref: G05F3/26)|  takes precedence0.749
G06F9/4403Processor initialisation0.748
H02H1/04Arrangements for preventing response to transient abnormal conditions  e.g. to lightning | or to short duration over voltage or oscillations| Damping the influence of dc component by short circuits in ac networks0.746
H03L7/08Details of the phase-locked loop0.746
B60C23/0471System initialisation  e.g. upload or calibration of operating parameters0.744
H02M3/06using resistors or capacitors  e.g. potential divider0.741
H03K5/088modified by switching  e.g. by a periodic signal or by a signal in synchronism with the transitions of the output signal0.738
G06F15/7814Specially adapted for real time processing  e.g. comprising hardware timers0.737
H02M3/07using capacitors charged and discharged alternately by semiconductor devices with control electrode |   e.g. charge pumps | for substrate bias voltage generators | (ref: G05F3/205)| | for static stores | (ref: G11C5/145)|   | (ref: G11C16/06)| | charge pumping structures for internal polarisation | (ref: H01L27/0222)0.735
G06F1/3215Monitoring of peripheral devices0.732
G06F12/00Accessing  addressing or allocating within memory systems or architectures | digital input from  or digital output to record carriers  e.g. to disk storage units  | (ref: G06F3/06)0.728
G06F1/3209Monitoring remote activity  e.g. over telephone line  network connection0.726
G06K19/0701at least one of the integrated circuit chips comprising an arrangement for power management0.725
G01R19/16552in I.C. power supplies0.720
H04L12/40Bus networks0.719
G06F1/3243Power saving in microcontroller unit0.717
G06F11/0757by exceeding a time limit  i.e. time-out  e.g. watchdogs0.716
G11C16/225Preventing erasure  programming or reading when power supply voltages are outside the required ranges0.715
G11C16/22Safety or protection circuits preventing unauthorised or accidental access to memory cells0.715
G11C16/34Determination of programming status  e.g. threshold voltage  overprogramming or underprogramming  retention0.715
G06F15/76Architectures of general purpose stored program computers | with program plugboard | (ref: G06F15/08)| | multicomputers | (ref: G06F15/16)0.712
H04Q9/14Calling by using pulses0.710
H02M3/157with digital control0.708
G11C27/02Sample-and-hold arrangements | (ref: G11C27/04)|  takes precedence| sampling electrical signals  in general | (ref: H03K)0.707
B60R16/0315using multiplexing techniques | multiplexing for transmission of signals | (ref: G08C15/00)| | multiplexing for electrical communication in general | (ref: H04J)0.707
G01R31/00Arrangements for testing electric properties| Arrangements for locating electric faults| Arrangements for electrical testing characterised by what is being tested not provided for elsewhere | measuring superconductive properties | (ref: G01R33/1238)| ||  testing or measuring semiconductors or solid state devices during manufacture | (ref: H01L22/00)| | testing line transmission systems | (ref: H04B3/46)0.707
G06F9/24Loading of the microprogram0.704
H02M1/10Arrangements incorporating converting means for enabling loads to be operated at will from different kinds of power supplies  e.g. from ac or dc0.703
G06F1/00Details not covered by groups | (ref: G06F3/00)|  – | (ref: G06F13/00)|  and | (ref: G06F21/00)|  | architectures of general purpose stored program computers | (ref: G06F15/76)0.703
G06Q30/04Billing or invoicing |   e.g. tax processing in connection with a sale0.701
G11C13/00Digital stores characterised by the use of storage elements not covered by groups | (ref: G11C11/00)|   | (ref: G11C23/00)|  - | (ref: G11C25/00)0.701
G11C11/412using field-effect transistors only | latent image memory | (ref: G11C7/20)| | multi-port cells | (ref: G11C8/16)0.700
H03K19/0016by using a control or a clock signal  e.g. in order to apply power supply0.700
H03K19/00Logic circuits  i.e. having at least two inputs acting on one output| Inverting circuits | inverting circuits used as delay elements | (ref: H03K5/13)0.700
G06F9/30145Instruction analysis  e.g. decoding  instruction word fields0.699
H02J1/08Three-wire systems| Systems having more than three wires0.698
H03H19/004Switched capacitor networks0.694
G06F1/3287Power saving by switching off individual functional units in a computer system  i.e. selective power distribution0.684
H03K19/0963using transistors of complementary type | (ref: H03K19/0966)|  takes precedence0.682
H02M1/0845digitally controlled (or with digital control)0.680
G01R31/2853Electrical testing of internal connections or -isolation  e.g. latch-up or chip-to-lead connections | (ref: G01R31/31717)|  takes precedence| test of chip-to-PCB or lead-to-PCB connections | (ref: G01R31/04)0.679
G05B19/0423Input/output0.679
H03K17/164using parallel switching arrangements0.673
H02H3/207also responsive to under-voltage | window comparators for indication | (ref: G01R19/165)0.671
G11C7/1006Data managing  e.g. manipulating data before writing or reading out  data bus switches or control circuits therefor0.671
G06F11/0754by exceeding limits0.664
H03K19/17772for powering on or off0.664
G06F1/3206Monitoring a parameter  a device or an event triggering a change in power modality0.660
H03K19/018521of complementary type  e.g. CMOS0.324
H03K17/284in field effect transistor switches0.316
H03K5/19Monitoring patterns of pulse trains | indicating amplitude | (ref: G01R19/00)| | indicating frequency | (ref: G01R23/00)| | measuring characteristics of individual pulses | (ref: G01R29/02)0.308
H03K19/20characterised by logic function  e.g. AND  OR  NOR  NOT circuits | (ref: H03K19/003)|  - | (ref: H03K19/01)|  take precedence0.308
H03K3/0375provided with means for increasing reliability| for protection| for ensuring a predetermined initial state when the supply voltage has been applied| for storing the actual state when the supply voltage fails | digital storage cells each combining volatile and non-volatile storage properties | (ref: G11C14/00)0.307
H03K3/037Bistable circuits0.307
H03L5/00Automatic control of voltage  current  or power0.306
G06F1/3234Action  measure or step performed to reduce power consumption0.306
H03K5/02by amplifying | (ref: H03K5/04)|  takes precedence| wide-band amplifiers in general | (ref: H03F)0.302
H03K3/014Modifications of generator to ensure starting of oscillations0.301
H03B5/364the amplifier comprising field effect transistors | (ref: H03B5/366)|  takes precedence0.301
H03K3/02315Stabilisation of output  e.g. using crystal0.301
G06F1/08Clock generators with changeable or programmable clock frequency0.301
G11C5/143Detection of memory cassette insertion/removal| Continuity checks of supply and ground lines | in general | (ref: G01R31/02)| | Detection of supply variations/interruptions/levels | (ref: G11C5/148)|  takes precedence| | Switching between alternative supplies | back-up supplies | per se|  | (ref: H02J9/061)|   | (ref: G11C5/141)|  takes precedence0.299
G11C5/145Applications of charge pumps | charge pumps | per se|  | (ref: H02M3/07)| | Boosted voltage circuits | for logic circuits or inverting circuits | (ref: H03K19/00)| | Clamp circuits therefor | (ref: G11C5/141)|  takes precedence0.299
H03K17/30Modifications for providing a predetermined threshold before switching | shaping pulses by thresholding | (ref: H03K5/08)|   | | for logic circuits | (ref: H03K19/0021)0.298
H03K19/17764for reliability0.298
H03K19/17736Structural details of routing resources0.298
H03K17/14Modifications for compensating variations of physical values  e.g. of temperature0.297
H03K17/162without feedback from the output circuit to the control circuit0.294
B60T8/885using electrical circuitry0.294
G06F1/04Generating or distributing clock signals or signals derived directly therefrom0.294
H02M1/36Means for starting or stopping converters0.294
H02M1/00Details of apparatus for conversion0.294
H02M1/08Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters0.294
H02M3/155using semiconductor devices only0.294
H02M3/33507with automatic control of the output voltage or current | (ref: H02M3/33561)|   | (ref: H02M3/33569)|  take precedence0.294
G05F3/24wherein the transistors are of the field-effect type only | (ref: G05F3/205)|   | (ref: G05F3/26)|   | (ref: G05F3/30)|  take precedence0.294
G06F1/3275Power saving in memory  e.g. RAM  cache0.291
G11C5/148Details of power up or power down circuits  standby circuits or recovery circuits0.291
G11C5/14Power supply arrangements | in general | (ref: G05F)|   | (ref: H02J)|   | (ref: H02M)|   | e.g. Power down/chip (de)selection  layout of wiring/power grids  multiple supply levels0.291
G06F21/87by means of encapsulation  e.g. for integrated circuits0.287
G01R31/2818using test structures on  or modifications of  the card under test  made for the purpose of testing  e.g. additional components or connectors | (ref: G01R31/2805)|  takes precedence| printed circuits having  e.g. symbols  test patterns or visualisation means | (ref: H05K1/0266)0.287
G06F21/81by operating on the power supply  e.g. enabling or disabling power-on  sleep or resume operations0.287
G06F21/71to assure secure computing or processing of information0.287
G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values | circuits with regenerative action  e.g. Schmitt trigger | (ref: H03K3/00)| | threshold switches | (ref: H03K17/00)0.287
G05B15/02electric0.286
H03K3/033Monostable circuits0.286
G11C11/4074Power supply or voltage generation circuits  e.g. bias voltage generators  substrate voltage generators  back-up power  power control circuits0.285
G11C11/4099Dummy cell treatment| Reference voltage generators0.285
H03K19/17792for operating speed0.284
G01R19/16538in AC or DC supplies | (ref: G01R19/16519)|  and | (ref: G01R19/16528)|  take precedence0.283
G05F1/465Internal voltage generators for integrated circuits  e.g. step down generators0.283
G10H7/004with one or more auxiliary processor in addition to the main processing unit0.283
G06F1/3293Power saving by switching to a less power consuming processor  e.g. sub-CPU0.283
G06F1/22Means for limiting or controlling the pin/gate ratio0.280
B60C23/0474Measurement control  e.g. setting measurement rate or calibrating of sensors| Further processing of measured values  e.g. filtering  compensating or slope monitoring0.279
G06F11/3058Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component  e.g. monitoring of power  currents  temperature  humidity  position  vibrations | thermal management in cooling arrangements of a computing system | (ref: G06F1/206)0.278
G06F11/3055Monitoring arrangements for monitoring the status of the computing system or of the computing system component  e.g. monitoring if the computing system is on  off  available  not available | error or fault processing without redundancy | (ref: G06F11/0703)| | error detection or correction by redundancy in data representation | (ref: G06F11/08)| | error detection or correction by redundancy in operation | (ref: G06F11/14)| | error detection or correction by redundancy in hardware | (ref: G06F11/16)0.278
G06F11/3062where the monitored property is the power consumption | power management in a computing system | (ref: G06F1/3203)0.278
H03K17/302in field-effect transistor switches0.273
H03K17/145in field-effect transistor switches0.273
G06F9/4418Suspend and resume| Hibernate and awake0.273
G06F13/4072Drivers or receivers | (ref: G06F13/4086)|  takes precedence| for multistate logic circuits | (ref: H03K19/0002)0.272
G06K7/0086the connector comprising a circuit for steering the operations of the card connector0.272
H04M1/738Interface circuits for coupling substations to external telephone lines | (ref: H04M1/78)|  takes precedence0.272
G06K7/0013by galvanic contacts  e.g. card connectors for ISO-7816 compliant smart cards or memory cards  e.g. SD card readers | connectors in general | (ref: H01R13/00)| | connectors for SIM cards used in mobile phones or the like | (ref: H04B1/3816)0.272
H03K17/7955using phototransistors0.272
G06K7/0008General problems related to the reading of electronic memory record carriers  independent of its reading method  e.g. power transfer0.272
H04M1/745Protection devices or circuits for voltages surges on the line0.272
H04M1/82Line monitoring circuits for call progress or status discrimination | for detecting caller identity | (ref: H04M1/573)0.272
G06F1/325Power saving in peripheral device0.270
G06F13/40Bus structure | for computer networks | (ref: G06F15/163)| | for optical bus networks | (ref: H04B10/25)0.270
H03K17/60using bipolar transistors0.269
H03K17/687using field-effect transistors0.269
G06F1/10Distribution of clock signals |   e.g. skew0.268
G06F9/30101Special purpose registers0.268
G11C11/4093Input/output [I/O] data interface arrangements  e.g. data buffers0.268
G11C16/12Programming voltage switching circuits0.268
G06F1/305in the event of power-supply fluctuations0.267
G06F11/08Error detection or correction by redundancy in data representation  e.g. by using checking codes0.266
G06F9/46Multiprogramming arrangements0.266
H05B41/2828using control circuits for the switching elements | (ref: H05B41/2827)|  takes precedence0.265
H02M3/1588comprising at least one synchronous rectifier element | (ref: H02M3/1582)|   | (ref: H02M3/1584)|  take precedence0.265
H03M5/08Code representation by pulse width0.265
G05F3/262using field-effect transistors only0.265
H02M3/156with automatic control of output voltage or current  e.g. switching regulators0.265
H03L7/0996Selecting a signal among the plurality of phase-shifted signals produced by the ring oscillator0.265
H03K5/133using a chain of active delay devices0.265
H04L69/40Techniques for recovering from a failure of a protocol instance or entity  e.g. failover routines  service redundancy protocols  protocol state redundancy or protocol service redirection in case of a failure or disaster recovery | network fault management | (ref: H04L41/06)| | route fault recovery in network routing | (ref: H04L45/28)| | fault recovery in packet switches | (ref: H04L49/557)| | reactions to failures of replicated servers by a load balancer | (ref: H04L67/1034)| | departure or maintenance mechanisms in peer-to-peer networks | (ref: H04L67/1048)| | intermediate processing of oper0.265
G06F11/2007using redundant communication media0.265
H04L12/40006Architecture of a communication node | current supply arrangements | (ref: H04L12/10)| | intermediate storage or scheduling | (ref: H04L49/90)0.265
G11C7/1045Read-write mode select circuits0.265
G06F1/206comprising thermal management0.264
G06F9/445Program loading or initiating | bootstrapping | (ref: G06F9/4401)| | security arrangements for program loading or initiating | (ref: G06F21/57)0.264
G05F3/08wherein the variable is dc0.264
G06K19/0723the record carrier comprising an arrangement for non-contact communication  e.g. wireless communication circuits on transponder cards  non-contact smart cards or RFIDs0.264
G01R21/133by using digital technique0.263
H03K19/177arranged in matrix form0.262
G06F9/30167of immediate specifier  e.g. constants0.262
G06F11/2236to test CPU or processors0.262
G06F11/261by simulating additional hardware  e.g. fault simulation0.262
G06F15/7867with reconfigurable architecture0.260
H02M1/32Means for protecting converters other than automatic disconnection | emergency protective circuit arrangements specially adapted for converters with automatic disconnection | (ref: H02H7/10)0.257
G06F13/4022using switching circuits  e.g. switching matrix  connection or expansion network | (ref: G06F13/4009)|  takes precedence0.257
G06F8/654using techniques specially adapted for alterable solid state memories  e.g. for EEPROM or flash memories0.257
G06F8/61Installation0.257
H02M1/42Circuits or arrangements for compensating for or adjusting power factor in converters or inverters0.257
H02M1/4225using a non-isolated boost converter0.257
H02P29/02Providing protection against overload without automatic interruption of supply | protection against faults of stepper motors | (ref: H02P8/36)0.257
H02P23/26Power factor control [PFC]0.257
G06F13/4282on a serial bus  e.g. I2C bus  SPI bus | on daisy chain buses | (ref: G06F13/4247)0.257
H03K23/005using minimum change code  e.g. Gray Code0.256
H03K19/215using field-effect transistors0.256
H03K23/40Gating or clocking signals applied to all stages  i.e. synchronous counters | (ref: H03K23/74)|  - | (ref: H03K23/84)|  take precedence0.256
H03K19/00315in field-effect transistor circuits0.255
G06F11/3031where the computing system component is a motherboard or an expansion card0.253
G06F13/24using interrupt | (ref: G06F13/32)|  takes precedence0.253
H03K3/0231Astable circuits | (ref: H03K3/0315)|  takes precedence0.252
G11C7/24Memory cell safety or protection circuits  e.g. arrangements for preventing inadvertent reading or writing| Status cells| Test cells0.252
H03K19/018592with a bidirectional operation0.249
H03K19/17756for partial configuration or reconfiguration0.249
H03K19/01759with a bidirectional operation0.249
G06F1/3237Power saving by disabling clock generation or distribution0.249
H03K17/24Storing the actual state when the supply voltage fails0.248
G01R21/006Measuring power factor0.246
B60W10/18including control of braking systems0.246
H03K2217/0036Means reducing energy consumption0.059
H03K2005/00078Fixed delay0.051
Y02D10/00Energy efficient computing0.051
H03K19/21EXCLUSIVE-OR circuits  i.e. giving output if input signal exists at only one input| COINCIDENCE circuits  i.e. giving output only if all input signals are identical0.050
H01L23/5256comprising fuses  i.e. connections having their state changed from conductive to non-conductive0.050
B60T2270/402Back-up0.049
G06F11/20using active fault-masking  e.g. by switching out faulty elements or by switching in spare elements0.049
H02M2001/0048Circuits or arrangements for reducing losses | using snubbers | (ref: H02M1/34)0.049
Y02B70/10Technologies improving the efficiency by using switched-mode power supplies [SMPS]  i.e. efficient power electronics conversion0.049
G10H2240/275Musical interface to a personal computer PCI bus  "peripheral component interconnect bus"0.047
G01R19/16528using digital techniques or performing arithmetic operations | using digital techniques to measure a voltage or a current  | see|  | (ref: G01R19/25)0.047
G10H2230/035Power management  i.e. specific power supply solutions for electrophonic musical instruments  e.g. auto power shut-off  energy saving designs  power conditioning  connector design  avoiding inconvenient wiring0.047
H02H1/06Arrangements for supplying operative power | power supply arrangements in general | (ref: G05F)|   | (ref: H02M)0.047
G06F2201/81Threshold0.046
G11C17/18Auxiliary circuits  e.g. for writing into memory | in general | (ref: G11C7/00)0.046
Y10S323/901Starting circuits0.046
G06F11/221to test buses  lines or interfaces  e.g. stuck-at or open line faults0.046
Y02B20/00Energy efficient lighting technologies0.044
H04L12/4625Single bridge functionality  e.g. connection of two networks over a single bridge0.044
G05B2219/25032CAN  canbus  controller area network bus0.044
H04L2012/40215Controller Area Network CAN0.044
G05B2219/25182Serial between host and modules  nodes  parallel in node to microcontroller0.044
Y04S50/12Billing  invoicing  buying or selling transactions or other related activities  e.g. cost or usage evaluation0.044
G05B19/042using digital processors | (ref: G05B19/05)|  takes precedence0.043
G06F12/0246in block erasable memory  e.g. flash memory0.043
G06F9/223Execution means for microinstructions irrespective of the microinstruction function  e.g. decoding of microinstructions and nanoinstructions| timing of microinstructions| programmable logic arrays| delays and fan-out problems0.043
G05B2219/2614HVAC  heating  ventillation  climate control0.043
G06F2212/7201Logical to physical mapping or translation of blocks or pages0.043
G05B2219/34427Diagnostic  monitoring incorporated in controller0.042
G05B2219/25257Microcontroller0.042
G06F2213/0038System on Chip0.042
G11C2207/104Embedded memory devices  e.g. memories with a processing device on the same die or ASIC memory designs0.042
G06F11/1415at system level0.042
H03K2217/0081Power supply means  e.g. to the switch driver0.041
G01R31/40Testing power supplies | testing photovoltaic devices | (ref: H02S50/10)0.041
B60W2710/18Braking system0.041
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